Quantitative laser-based x-ray fluorescence and particle-induced x-ray emission

Abstract In this work, we demonstrate the feasibility of quantitative laser-based x-ray fluorescence (XRF) combined with particle-induced emission (PIXE) (called XPIF for and fluorescence) spectroscopy analysis elemental composition in solid samples. A multi-hundred TW laser system accelerated protons produced x-rays that were impinging on samples, inducing characteristic line emissions elements contained material. The yield obtained from each element can be related to its mass concentration using both thick PIXE XRF formalism. This is performed by an iterative numerical procedure. We tested validity our method three homogeneous metallic materials, stainless steel, bronze brass. proportions these samples retrieved (XPIF) within errors bars compared a commercial energy dispersive spectrometer.